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Reliability (semiconductor)

Reliability of semiconductor devices can be summarized as follows:

Metrics Summary

Total Publications
Lifetime
52,094
Prior Five Years
8,293
Total Citations
Lifetime
361,823
Prior Five Years
53,150
Total Scholars
Lifetime
54,041
Prior Five Years
40,568

Publications and Citation History

Publications based on Disciplines

Scholars based on Disciplines

Publications based on Fields

Scholars based on Fields

Highly Ranked Scholars™

Lifetime
Prior Five Years

Highly Cited Publications

Lifetime