Takashi Hamada
ScholarGPS® ID: 75852256724610
Affiliation History
Discipline
Electrical and Computer Engineering
Top Specialties
Manufacturing | Semiconductor | Semiconductor Device | Display Device | Field-effect Transistor | Thin-film Transistor
Metrics Summary
Publication Count
56
Predicted Citations
325
Predicted h-index
10
Ranking
Publications and Citation History
Publications based on Top Specialties
Types of Publication
- Publications
- Books
- Patents
- NIH/NSF
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Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory (conference) 2023 IEEE International Reliability Physics Symposium (IRPS) (2023) Monterey, CA, USA |
Patent Number: 10693013 (2020) |
Patent Number: 10367014 (2019) |
Patent Number: 10141452 (2018) |
Patent Number: 10043914 (2018) |
Patent Number: 9935203 (2018) |
Patent Number: 9882061 (2018) |
Patent Number: 9871145 (2018) |
Patent Number: 9773919 (2017) |
Patent Number: 9728693 (2017) |
Patent Number: 9691905 (2017) |
Patent Number: 9478593 (2016) |
Method for manufacturing a semiconductor device comprising a plurality of oxide semiconductor layers (patent) Patent Number: 9368636 (2016) |
Properties of c-axis-aligned crystalline indium–gallium–zinc oxide field-effect transistors fabricated through a tapered-trench gate process (journal article) Japanese Journal of Applied Physics, volume 55, issue 4S, pages 04EG09- (2016). |
Effect of Surrounded-Channel Structure on Electrical Characteristics of $c$ -Axis Aligned Crystalline In–Ga–Zn–O Field-Effect Transistor (journal article) IEEE Electron Device Letters, volume 36, issue 4, pages 309-311 (2015). |
Patent Number: 8890127 (2014) |