John Purviance

ScholarGPS® ID: 70376026034355

Affiliation
Virginia Polytechnic Institute and State University, Blacksburg, United States
Affiliation History

Field
Engineering and Computer Science
Discipline
Computer Science
Top Specialties
Microwave | Control Theory | Computer-aided Engineering | Circuit Design
Metrics Summary
Publication Count
31
Predicted Citations
291
Predicted h-index
8
Ranking

Publications and Citation History

Publications based on Top Specialties

Types of Publication

  • Publications
  • Books
  • Patents
  • NIH/NSF
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GroundTruth: Augmenting Expert Image Geolocation with Crowdsourcing and Shared Representations (journal article)
Venkatagiri, Sukrit | Thebault-Spieker, Jacob | Kohler, Rachel | Purviance, John | Mansur, Rifat Sabbir | Luther, Kurt
Proceedings of the ACM on Human-Computer Interaction, volume 3, issue CSCW, pages 1-30 (2019).
10.1145/3359209
Cited by (24) | Cite | Source
Geolocating Images with Crowdsourcing and Diagramming (conference)
Kohler, Rachel | Purviance, John | Luther, Kurt
Twenty-Seventh International Joint Conference on Artificial Intelligence {IJCAI-18} (2018)
Stockholm, Sweden
10.24963/ijcai.2018/741
Cited by (1) | Cite | Source
Supporting Image Geolocation with Diagramming and Crowdsourcing (journal article)
Kohler, Rachel | Purviance, John | Luther, Kurt
Proceedings of the AAAI Conference on Human Computation and Crowdsourcing, volume 5 (2017).
10.1609/hcomp.v5i1.13296
Cited by (2) | Cite | Source
Work-in-Progress: High-Frequency Environmental Monitoring Using a Raspberry Pi-Based System (conference)
Basu, Debarati | Purviance, John | Maczka, Darren | Brogan, Daniel | Lohani, Vinod
2015 ASEE Annual Conference and Exposition (2015)
Seattle, Washington
10.18260/p.25103
Cited by (4) | Cite | Source | Open Access
Interpolation modeling of S‐parameter data bases for use in Monte Carlo simulations (journal article)
Campbell, Lowell L. | Purviance, John E.
International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, volume 4, issue 3, pages 282-296 (1994).
10.1002/mmce.4570040308
Cited by (3) | Cite | Source
Interpolative response modeling for Monte Carlo simulation (conference)
Campbell, L. | Purviance, J.
IEEE/MTT-S International Microwave Symposium - MTT '94 (1994)
San Diego, CA, USA
10.1109/MWSYM.1994.335417
Cite | Source
Yield And Reliability In Microwave Circuit And System Design (book)
Meehan, Michael D | Purviance, John
Artech House (1993)
Cited by (11) | Cite
Yield sensitivity of HEMT circuits to process parameter variations (journal article)
Sarker, J.C. | Purviance, J.E.
IEEE Transactions on Microwave Theory and Techniques, volume 40, issue 7, pages 1572-1576 (1992).
10.1109/22.146339
Cited by (5) | Cite | Source
Statistical performance sensitivity-a valuable measure for manufacturing oriented CAD (conference)
Purviance, J. | Meehan, M.
1992 IEEE Microwave Symposium Digest MTT-S (1992)
Albuquerque, NM, USA
10.1109/MWSYM.1992.188132
Cited by (4) | Cite | Source
Yield sensitivity study of A1GaAs/GaAs high electron mobility transistor (journal article)
Sarker, Jogendra C. | Purviance, John E.
International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, volume 2, issue 1, pages 12-27 (1992).
10.1002/mmce.4570020104
Cited by (1) | Cite | Source
Statistical design for microwave systems (conference)
Cooke, R. | Purviance, J.
1991 IEEE MTT-S International Microwave Symposium Digest (1991)
Boston, MA, USA
10.1109/MWSYM.1991.147094
Cited by (3) | Cite | Source
Statistical interpolation of FET data base measurements (conference)
Campbell, L. | Purviance, J. | Potratz, C.
1991 IEEE MTT-S International Microwave Symposium Digest (1991)
Boston, MA, USA
10.1109/MWSYM.1991.146962
Cited by (5) | Cite | Source
CAD for statistical analysis and design of microwave circuits (journal article)
Purviance, John | Meehan, Michael
International Journal of Microwave and Millimeter-Wave Computer-Aided Engineering, volume 1, issue 1, pages 59-76 (1991).
10.1002/mmce.4570010107
Cited by (30) | Cite | Source
Properties of FET parameter statistical data bases (conference)
Purviance, J. | Meehan, M. | Collins, D.
IEEE International Digest on Microwave Symposium (1990)
Dallas, TX, USA
10.1109/MWSYM.1990.99644
Cited by (12) | Cite | Source
An efficient linear statistical FET model (conference)
Petzold, M. | Purviance, J. | Potratz, C.
IEEE MTT-S International Microwave Symposium Digest (1989)
Long Beach, CA, USA
10.1109/MWSYM.1989.38743
Cited by (5) | Cite | Source
High yield matching structures for 20% bandwidth microwave amplifiers (conference)
Brakensiek, W. | Purviance, J. | Ferguson, T.
IEEE MTT-S International Microwave Symposium Digest (1989)
Long Beach, CA, USA
10.1109/MWSYM.1989.38758
Cited by (2) | Cite | Source
A linear statistical FET model using principal component analysis (journal article)
Purviance, J.E. | Petzold, M.C. | Potratz, C.
IEEE Transactions on Microwave Theory and Techniques, volume 37, issue 9, pages 1389-1394 (1989).
10.1109/22.32222
Cited by (26) | Cite | Source
High-yield narrow-band matching structures (journal article)
Monteith, D.H. | Purviance, J.E.
IEEE Transactions on Microwave Theory and Techniques, volume 36, issue 12, pages 1621-1628 (1988).
10.1109/22.17393
Cited by (3) | Cite | Source
A Time-Varying Communications Approach to Decentralized Fixed Modes (conference)
Purviance, John E | Feeley, Joseph J
1988 American Control Conference (1988)
Atlanta, GA, USA
10.23919/ACC.1988.4789965
Cite | Source
A Time-Varying Communications Approach to Decentralized Fixed Modes (conference)
Purviance, John E. | Feeley, Joseph J.
American Control Conference (1988)
10.1109/ACC.1988.4172988
Cite | Source