Matthew R. Linford

ScholarGPS® ID: 23510158983990

Affiliation
Brigham Young University, Provo, United States
Affiliation History

Field
Physical Sciences and Mathematics
Discipline
Chemistry
Top Specialties
Spectroscopy | Chromatography | Photoemission Spectroscopy | X-ray | X-ray Photoelectron Spectroscopy | Data Storage | Surface Weather Analysis | Nanotube | Analytical Chemistry | Carbon Nanotube | Mass Spectrometry | Polymer | Thin-layer Chromatography | Microscopy | Energy
Metrics Summary
Publication Count
304
Predicted Citations
13,260
Predicted h-index
52
Ranking

Publications and Citation History

Publications based on Top Specialties

Types of Publication

  • Publications
  • Books
  • Patents
  • NIH/NSF
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New challenges associated with hard X‐ray photoelectron spectroscopy (report on the 2023 ASTM E42‐ASSD AVS workshop) (journal article)
Herrera‐Gomez, Alberto | Cant, David J. H. | Conard, Thierry | Renault, Olivier | Linford, Matthew R. | Pinder, Joshua W. | Fenton, Jeff | Baer, Donald R.
Surface and Interface Analysis (2024).
10.1002/sia.7340
Cite | Source
A practical guide to interpreting low energy ion scattering (LEIS) spectra (journal article)
Průša, Stanislav | Linford, Matthew R. | Vaníčková, Elena | Bábík, Pavel | Pinder, Joshua W. | Šikola, Tomáš | Brongersma, Hidde H.
Applied Surface Science, volume 657 (2024).
10.1016/j.apsusc.2023.158793
Cited by (5) | Cite | Source
How Long Is Long-Term? - An Update (journal article)
Lunt, Barry M. | Kemp, Daniel | Linford, Matthew R. | Chiang, Wood
Archiving Conference, volume 21, issue 1, pages 56-59 (2024).
10.2352/issn.2168-3204.2024.21.1.11
Cite | Source
New method for collecting XPS and other spectra: A thought (Gedanken) experiment (journal article)
Jafari, Samira | Snow, Gregory | Terry, Jeff | Linford, Matthew R.
Hybrid Advances, volume 5 (2024).
10.1016/j.hybadv.2024.100157
Cited by (1) | Cite | Source
Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters (journal article)
Pinder, Joshua W. | Major, George H. | Baer, Donald R. | Terry, Jeff | Whitten, James E. | Čechal, Jan | Crossman, Jacob D. | Lizarbe, Alvaro J. | Jafari, Samira | Easton, Christopher D. | ... | Linford, Matthew R.
Applied Surface Science Advances, volume 19 (2024).
10.1016/j.apsadv.2023.100534
Cited by (12) | Cite | Source
Surface analysis insight note: An example of a cluster analysis of spectra from an X‐ray photoelectron spectroscopy image (journal article)
Moeini, Behnam | Linford, John M. | Gallagher, Neal | Linford, Matthew R.
Surface and Interface Analysis, volume 56, issue 2, pages 73-81 (2024).
10.1002/sia.7270
Cited by (1) | Cite | Source
Surface analysis insight note: Multivariate curve resolution of an X‐ray photoelectron spectroscopy image (journal article)
Moeini, Behnam | Gallagher, Neal | Linford, Matthew R.
Surface and Interface Analysis, volume 55, issue 12, pages 853-858 (2023).
10.1002/sia.7260
Cited by (1) | Cite | Source
Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings (journal article)
Moeini, Behnam | Fullwood, David T. | Minson, Paul | Shollenberger, Daniel | Bell, David S. | Argyle, Morris D. | Vanfleet, Richard | Linford, Matthew R.
Surface and Coatings Technology, volume 473 (2023).
10.1016/j.surfcoat.2023.130014
Cited by (3) | Cite | Source
Surface analysis insight note: Analysis of X‐ray photoelectron spectroscopy images with summary statistics (journal article)
Moeini, Behnam | Linford, Matthew R.
Surface and Interface Analysis, volume 55, issue 11, pages 789-797 (2023).
10.1002/sia.7248
Cited by (1) | Cite | Source
Surface analysis insight note. Principal component analysis (PCA) of an X‐ray photoelectron spectroscopy image. The importance of preprocessing (journal article)
Moeini, Behnam | Avval, Tahereh G. | Gallagher, Neal | Linford, Matthew R.
Surface and Interface Analysis, volume 55, issue 11, pages 798-807 (2023).
10.1002/sia.7252
Cited by (5) | Cite | Source
Controlling the surface silanol density in capillary columns and planar silicon via the self-limiting, gas-phase deposition of tris(dimethylamino)methylsilane, and quantification of surface silanols after silanization by low energy ion scattering (journal article)
Moeini, Behnam | Pinder, Joshua W. | Avval, Tahereh G. | Jacobsen, Collin | Brongersma, Hidde H. | Průša, Stanislav | Bábík, Pavel | Vaníčková, Elena | Argyle, Morris D. | Strohmeier, Brian R. | ... | Linford, Matthew R.
Journal of Chromatography A, volume 1707 (2023).
10.1016/j.chroma.2023.464248
Cite | Source
Insight note: X‐ray photoelectron spectroscopy (XPS) peak fitting of the Al 2p peak from electrically isolated aluminum foil with an oxide layer (journal article)
Lizarbe, Alvaro J. | Major, George H. | Fernandez, Vincent | Fairley, Neal | Linford, Matthew R.
Surface and Interface Analysis, volume 55, issue 9, pages 651-657 (2023).
10.1002/sia.7238
Cited by (5) | Cite | Source
Surface analysis insight note: Initial, statistical evaluation of X‐ray photoelectron spectroscopy images (journal article)
Moeini, Behnam | Linford, Matthew R.
Surface and Interface Analysis, volume 55, issue 8, pages 572-578 (2023).
10.1002/sia.7218
Cited by (7) | Cite | Source
Introduction to Chemical State Analysis by XPS with Examples (book chapter)
In Applications of X-ray Photoelectron Spectroscopy to Catalytic Studies
Major, George H. | Fairley, Neal | Fernandez, Vincent | Linford, Matthew R.
WORLD SCIENTIFIC (EUROPE) (2023)
10.1142/9781800613294_0003
Cited by (1) | Cite | Source
Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature (journal article)
Major, George H. | Clark, B. Maxwell | Cayabyab, Kevin | Engel, Nathan | Easton, Christopher D. | Čechal, Jan | Baer, Donald R. | Terry, Jeff | Linford, Matthew R.
Journal of Vacuum Science & Technology A, volume 41, issue 4 (2023).
10.1116/6.0002714
Cited by (6) | Cite | Source
Area-Selective Atomic Layer Deposition of ZnO on Si\SiO2 Modified with Tris(dimethylamino)methylsilane (journal article)
Moeini, Behnam | Avval, Tahereh G. | Brongersma, Hidde H. | Průša, Stanislav | Bábík, Pavel | Vaníčková, Elena | Strohmeier, Brian R. | Bell, David S. | Eggett, Dennis | George, Steven M. | Linford, Matthew R.
Materials, volume 16, issue 13, pages 4688- (2023).
10.3390/ma16134688
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A tag-and-count approach for quantifying surface silanol densities on fused silica based on atomic layer deposition and high-sensitivity low-energy ion scattering (journal article)
Avval, Tahereh G. | Průša, Stanislav | Cushman, Cody V. | Hodges, Grant T. | Fearn, Sarah | Kim, Seong H. | Čechal, Jan | Vaníčková, Elena | Bábík, Pavel | Šikola, Tomáš | ... | Linford, Matthew R.
Applied Surface Science, volume 607 (2023).
10.1016/j.apsusc.2022.154551
Cited by (8) | Cite | Source
Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting (journal article)
Major, George H. | Fernandez, Vincent | Fairley, Neal | Smith, Emily F. | Linford, Matthew R.
Journal of Vacuum Science & Technology A, volume 40, issue 6 (2022).
10.1116/6.0001975
Cited by (26) | Cite | Source
Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). I. Introduction to methods useful for large or complex datasets (journal article)
Avval, Tahereh G. | Gallagher, Neal | Morgan, David | Bargiela, Pascal | Fairley, Neal | Fernandez, Vincent | Linford, Matthew R.
Journal of Vacuum Science & Technology A, volume 40, issue 6 (2022).
10.1116/6.0002082
Cited by (13) | Cite | Source
Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). II. Example applications of multiple methods to the degradation of cellulose and tartaric acid (journal article)
Avval, Tahereh G. | Haack, Hyrum | Gallagher, Neal | Morgan, David | Bargiela, Pascal | Fairley, Neal | Fernandez, Vincent | Linford, Matthew R.
Journal of Vacuum Science & Technology A, volume 40, issue 6 (2022).
10.1116/6.0001969
Cited by (13) | Cite | Source