Lei Ma

ScholarGPS® ID: 13015502905473

Affiliation
University of Alberta, Edmonton, Canada
Affiliation History

Field
Engineering and Computer Science
Discipline
Electrical and Computer Engineering
Top Specialties
Neural Network
Metrics Summary
Publication Count
5
Predicted Citations
69
Predicted h-index
5
Ranking

Publications and Citation History

Publications based on Top Specialties

Types of Publication

  • Publications
  • Books
  • Patents
  • NIH/NSF
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GraphSearchNet: Enhancing GNNs via Capturing Global Dependencies for Semantic Code Search (journal article)
Liu, Shangqing | Xie, Xiaofei | Siow, Jingkai | Ma, Lei | Meng, Guozhu | Liu, Yang
IEEE Transactions on Software Engineering, volume 49, issue 4, pages 2839-2855 (2023).
10.1109/TSE.2022.3233901
Cited by (13) | Cite | Source
Breaking Neural Reasoning Architectures With Metamorphic Relation-Based Adversarial Examples (journal article)
Chan, Alvin | Ma, Lei | Juefei-Xu, Felix | Ong, Yew-Soon | Xie, Xiaofei | Xue, Minhui | Liu, Yang
IEEE Transactions on Neural Networks and Learning Systems, volume 33, issue 11, pages 6976-6982 (2022).
10.1109/TNNLS.2021.3072166
Cited by (6) | Cite | Source
An Empirical Study on Data Distribution-Aware Test Selection for Deep Learning Enhancement (journal article)
Hu, Qiang | Guo, Yuejun | Cordy, Maxime | Xie, Xiaofei | Ma, Lei | Papadakis, Mike | Le Traon, Yves
ACM Transactions on Software Engineering and Methodology, volume 31, issue 4, pages 1-30 (2022).
10.1145/3511598
Cited by (23) | Cite | Source
An Empirical Study of the Impact of Hyperparameter Tuning and Model Optimization on the Performance Properties of Deep Neural Networks (journal article)
Liao, Lizhi | Li, Heng | Shang, Weiyi | Ma, Lei
ACM Transactions on Software Engineering and Methodology, volume 31, issue 3, pages 1-40 (2022).
10.1145/3506695
Cited by (45) | Cite | Source
Physical security of deep learning on edge devices: Comprehensive evaluation of fault injection attack vectors (journal article)
Hou, Xiaolu | Breier, Jakub | Jap, Dirmanto | Ma, Lei | Bhasin, Shivam | Liu, Yang
Microelectronics Reliability, volume 120 (2021).
10.1016/j.microrel.2021.114116
Cited by (9) | Cite | Source